Fine structure in the Er-related emission spectrum from Er-Si-O matrices at room temperature under carrier mediated excitation.

2003

J. Lumin. , Volume 102-103 p. 819- 824

Additional Metadata
Persistent URL	doi.org/10.1016/s0022-2313(02)00648-8
Journal	J. Lumin.
Organisation	Photonic Materials
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Isshiki, H., Polman, A., & Kimura, T. (2003). Fine structure in the Er-related emission spectrum from Er-Si-O matrices at room temperature under carrier mediated excitation. J. Lumin., 102-103, 819–824. doi:10.1016/s0022-2313(02)00648-8

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