Analyses of natural organic pigments by ITMS, FTMS and TOF-MS

Wyplosz, N.; Heeren, Ron; Boon, J.J.

During the restoration of easel paintings microscopic paint samples can be removed to look into the fabrication proceeding or the subsequent modifications experienced by a particular area of the painting.

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Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Wyplosz, N., Heeren, R., & Boon, J. J. (1998). Analyses of natural organic pigments by ITMS, FTMS and TOF-MS. In Proceedings of the 46th ASMS Conference on Mass Spectrometry and Allied Topics, May 31 - June 4, 1998, Orlando, Florida (pp. 1012–1013).

Analyses of natural organic pigments by ITMS, FTMS and TOF-MS

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Analyses of natural organic pigments by ITMS, FTMS and TOF-MS

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