Vacancy-type and electrical defects in amorphous silicon probed by positrons and electrons

1992

Additional Metadata
Publisher	Materials Research Society
Editor	G.S. Was , L.E. Rehn , D.M. Follstaedt
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Roorda, S., Hakvoort, R. A., van Veen, A., Stolk, P. A., & Saris, F. W. (1992). Vacancy-type and electrical defects in amorphous silicon probed by positrons and electrons. In G. S. Was, L. E. Rehn, & D. M. Follstaedt (Eds.), Phase Formation and Modification by Beam-Solid Interactions : Symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A. (pp. 39–44).

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