The growth of indium on the Si(111) surface studied by X-ray reflectivity and Auger electron spectroscopy

1992

Surf. Sci. , Volume 277 p. 330- 336

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Journal	Surf. Sci.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Finney, M. S., Norris, C., Howes, P. B., & Vlieg, E. (1992). The growth of indium on the Si(111) surface studied by X-ray reflectivity and Auger electron spectroscopy. Surf. Sci., 277, 330–336.

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