Structural defects in amorphous silicon probed by sub-picosecond photocarrier dynamics

1992

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Publisher	Materials Research Society
Editor	M.O. Thompson , M.J. Aziz , G.B. Stephenson
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Stolk, P. A., Roorda, S., Calcagnile, L., Sinke, W., van Linden van den Heuvell, H. B., & Saris, F. W. (1992). Structural defects in amorphous silicon probed by sub-picosecond photocarrier dynamics. In M. O. Thompson, M. J. Aziz, & G. B. Stephenson (Eds.), Kinetics of Phase Transformations : Symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A. (pp. 15–20).

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