Structural relaxation in amorphous silicon and the role of network defects

1991

Additional Metadata
Journal	Nucl. Instrum. Methods Phys. Res. B
Organisation	Photonic Materials
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Roorda, S., Custer, J. S., Sinke, W., Poate, J. M., Jacobson, D. C., Polman, A., & Spaepen, F. (1991). Structural relaxation in amorphous silicon and the role of network defects. Nucl. Instrum. Methods Phys. Res., Sect B, 59/60, 344–352.

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