Combined (1X2) ® (1X1) transition and atomic roughening of Ge(001) studied with surface x-ray diffraction

1991

Phys. Rev. B , Volume 44 - Issue 3 p. 1134- 1138

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Journal	Phys. Rev. B
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Johnson, A. D., Norris, C., Frenken, J. W. M., Derbyshire, H. S., MacDonald, J. E., van Silfhout, R., & van der Veen, J. F. (1991). Combined (1X2) ® (1X1) transition and atomic roughening of Ge(001) studied with surface x-ray diffraction. Phys. Rev. B, 44(3), 1134–1138.

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