X-ray reflectivity of an Sb delta-doping layer in silicon

1990

J. Appl. Phys. , Volume 68 p. 5105- 5108

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Journal	J. Appl. Phys.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Slijkerman, W. F. J., Gay, J. M., Zagwijn, P. M., van der Veen, J. F., MacDonald, J. E., Williams, A. A., … van de Walle, G. F. A. (1990). X-ray reflectivity of an Sb delta-doping layer in silicon. J. Appl. Phys., 68, 5105–5108.

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