Investigation of the dynamics of the O2/Si(001) adsorption system by small-angle ion-surface scattering

1990

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Journal	Nucl. Instrum. Methods Phys. Res. B
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Rechtien, J. H., Imke, U., Snowdon, K. J., Reijnen, P. H. F., van den Hoek, P. J., Kleyn, A. W., & Namiki, A. (1990). Investigation of the dynamics of the O2/Si(001) adsorption system by small-angle ion-surface scattering. Nucl. Instrum. Methods Phys. Res., Sect B, 48, 339–343.

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