Layered synthetic multilayers for high resolution X-ray reflection in the 6 to 8 keV region

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Publisher	The International Society for Optical Engineering
Editor	F.E. Christensen
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Puik, E. J., van der Wiel, M. J., & Verhoeven, J. (1988). Layered synthetic multilayers for high resolution X-ray reflection in the 6 to 8 keV region. In F. E. Christensen (Ed.), X-ray Multilayers for Diffractometers, Monochromators, and Spectrometers : 17-19 August 1988, San Diego, California (pp. 111–118).

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