Summary abstract: structure characterization of silicide-silicon interfaces

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Journal	J. Vac. Sci. Technol. A
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Fischer, A. E. M. J. (1988). Summary abstract: structure characterization of silicide-silicon interfaces. J. Vac. Sci. Technol. A, 6, 2094–2095.

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