Ion-scattering analysis of semiconductor films

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Publisher	Hosei University Press
Editor	T. Sebe , Y. Yamamoto
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Marée, P. M. J., & van der Veen, J. F. (1988). Ion-scattering analysis of semiconductor films. In T. Sebe & Y. Yamamoto (Eds.), Application of Ion Beams in Materials Science : Proceedings of the 12th International Symposium of Hosei University, Tokyo, Japan, Sept. 2-4, 1987 (pp. 67–75).

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