Determination of the atomic structure of the epitaxial CoSi2:Si (111) interface using high-resolution Rutherford backscattering

1988

Phys. Rev. B , Volume 37 p. 6305- 6310

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Journal	Phys. Rev. B
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Fischer, A. E. M. J., Gustafsson, T., & van der Veen, J. F. (1988). Determination of the atomic structure of the epitaxial CoSi2:Si (111) interface using high-resolution Rutherford backscattering. Phys. Rev. B, 37, 6305–6310.

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