Epitaxial growth studied by surface x-ray diffraction

1988

Additional Metadata
Publisher	Cham: Springer
Editor	J.F. van der Veen , J.F. van der Veen , M.A. Van Hove
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	MacDonald, J. E., Norris, C., Vlieg, E., Denier van der Gon, A. W., van der Veen, J. F., & van der Veen, J. F. (1988). Epitaxial growth studied by surface x-ray diffraction. In J. F. van der Veen, J. F. van der Veen, & M. A. Van Hove (Eds.), The Structure of Surfaces II : Proceedings of the 2nd International Conference on the Structure of Surfaces (ICSOS II), Amsterdam, The Netherlands, June 22-25, 1987 (pp. 438–442).

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