Strain-induced surface reconstruction in the epitaxial Si-Ge(111) system

Additional Metadata
Publisher	World Scientific
Editor	O. Engstr
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Nakagawa, K., Marée, P. M. J., & van der Veen, J. F. (1987). Strain-induced surface reconstruction in the epitaxial Si-Ge(111) system. In O. Engstr (Ed.), 18th International Conference on the Physics of Semiconductors : Stockholm, Sweden, August 11-15, 1986 (pp. 93–96).

Publication