Geometric structure of the NiSi2-Si(111) interface: an x-ray standing-wave analysis

1986

Surf. Sci. , Volume 178 p. 36- 46

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Journal	Surf. Sci.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Vlieg, E., Fischer, A. E. M. J., van der Veen, J. F., Dev, B. N., & Materlik, G. (1986). Geometric structure of the NiSi2-Si(111) interface: an x-ray standing-wave analysis. Surf. Sci., 178, 36–46.

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