Characterization of ultrathin nickel layers on Si(111) using RHEED and RBS

1986

Appl. Surf. Sci. , Volume 27 p. 143- 150

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Journal	Appl. Surf. Sci.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Fischer, A. E. M. J., Marée, P. M. J., & van der Veen, J. F. (1986). Characterization of ultrathin nickel layers on Si(111) using RHEED and RBS. Appl. Surf. Sci., 27, 143–150.

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