High resolution studies of NiSi2 ultrathin film formation by ion scattering and cross-section tem

1985

Surf. Sci. , Volume 154 p. 52- 69

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Journal	Surf. Sci.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van Loenen, E. J., Fischer, A. E. M. J., van der Veen, J. F., & LeGoues, F. K. (1985). High resolution studies of NiSi2 ultrathin film formation by ion scattering and cross-section tem. Surf. Sci., 154, 52–69.

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