Quantitative microanalysis by heavy ion beam induced x-ray excitation

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Publisher	North-Holland
Editor	H.H. Andersen , J. Bottiger , H. Knudsen
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Mitchell, I. V., Lennard, W. N., & Sanders, J.-B. (1980). Quantitative microanalysis by heavy ion beam induced x-ray excitation. In H. H. Andersen, J. Bottiger, & H. Knudsen (Eds.), Ion Beam Analysis : Proceedings of the Fourth International Conference on Ion Beam Analysis, Aarhus, June 25-29, 1979 (pp. 121–123).

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