Surface layer analysis by MEIS using a solid state detector

1978

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Publisher	North-Holland
Editor	E.A. Wolicki , J.W. Butler , P.A. Treado
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Hoonhout, D., Kerkdijk, C. B. W., Bhattacharya, R. S., Kersten, H. H., Turkenburg, W. C., & Saris, F. W. (1978). Surface layer analysis by MEIS using a solid state detector. In E. A. Wolicki, J. W. Butler, & P. A. Treado (Eds.), Proceedings of the Third International Conference on Ion Beam Analysis : Washington, D.C., June 27-July 1, 1977 (pp. 355–360).

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