Silicon surface studies by means of proton backscattering and proton induced x-ray emission

1973

Radiat. Eff. , Volume 17 p. 245- 252

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Journal	Radiat. Eff.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van der Weg, W. F., Kool, W. H., Roosendaal, H. E., & Saris, F. W. (1973). Silicon surface studies by means of proton backscattering and proton induced x-ray emission. Radiat. Eff., 17, 245–252.

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