X-ray appearance potential measurements with a proportional counter

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Journal	Ned. Tijdschr. Vacuumtech.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Verhoeven, J., & Rieger, E. (1972). X-ray appearance potential measurements with a proportional counter. Ned. Tijdschr. Vacuumtech., 10.

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