Improvements in surface preparation of paint cross-sections necessary for advanced imaging techniques

Wyplosz, N.; Koper, R.; van der Weerd, J.; Heeren, Ron; Boon, J.J.

N. Wyplosz, R. Koper, J. van der Weerd, R.M.A. Heeren (Ron) and J.J. Boon

2000

Improvements in surface preparation of paint cross-sections necessary for advanced imaging techniques

A new polishing procedure is presented for the preparation of paint cross-sections with enhanced surface quality. As a result, chemical surface analysis by Fourier Transform Infrared (FTM) imaging spectroscopy and Laser Desorption lon Trap Mass Spectrometry (LDMS) is now possible. Surface quality is demonstrated by FTIR-imaging, Differential Interference Contrast (DIC) microscopy and Interferometric Profiling.

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Publisher	CNRS Editions
Editor	J. Goupy , J.-P. Mohen
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Wyplosz, N., Koper, R., van der Weerd, J., Heeren, R., & Boon, J. J. (2000). Improvements in surface preparation of paint cross-sections necessary for advanced imaging techniques. In J. Goupy & J.-P. Mohen (Eds.), Art et Chimie, la Couleur: Actes du congrÃ¨s (pp. 65–68).

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