2008
Imaging of carrier-envelope phase effects in above-threshold ionization with intense few-cycle laser fields
Publication
Publication
New J. Phys. , Volume 10 - Issue Article number: 25024 p. 1- 17
Sub-femtosecond control of the electron emission in abovethreshold ionization of the rare gases Ar, Xe and Kr in intense few-cycle laser fields is reported with full angular resolution. Experimental data that were obtained with the velocity-map imaging technique are compared to simulations using the strong-field approximation (SFA) and full time-dependent Schrödinger equation (TDSE) calculations. We find a pronounced asymmetry in both the energy and angular distributions of the electron emission that critically depends on the carrier-envelope phase (CEP) of the laser field. The potential use of imaging techniques as a tool for single-shot detection of the CEP is discussed.
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| doi.org/10.1088/1367-2630/10/2/025024 | |
| New J. Phys. | |
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Kling, M. F., Rauschenberger, J., Verhoef, A. J., Hasović, E., Uphues, T., Milosevic, D. B., … Vrakking, M. J. J. (2008). Imaging of carrier-envelope phase effects in above-threshold ionization with intense few-cycle laser fields. New J. Phys., 10(Article number: 25024), 1–17. doi:10.1088/1367-2630/10/2/025024 |
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