Spatially-resolved TOF-MS analysis of paint materials and easel paintings samples

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Publisher	Weinheim: Wiley
Editor	E. Gelpi
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Wyplosz, N., Duursma, M. C., Boon, J. J., & Heeren, R. (2001). Spatially-resolved TOF-MS analysis of paint materials and easel paintings samples. In E. Gelpi (Ed.), Advances in Mass Spectrometry; Vol. 15 (pp. 883–884).

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